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KOMATSU DENSHI KINZOKU KK

Overview
  • Total Patents
    1,149
About

KOMATSU DENSHI KINZOKU KK has a total of 1,149 patent applications. Its first patent ever was published in 1974. It filed its patents most often in Japan, Taiwan and United States. Its main competitors in its focus markets machines, surface technology and coating and semiconductors are SUMCO TECHXIV CORP, SUPER SILICON CRYSTAL RES INST and MEMC ELECTRONIC MATERIALS.

Patent filings per year

Chart showing KOMATSU DENSHI KINZOKU KKs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Hiraishi Yoshinobu 86
#2 Tomioka Junsuke 83
#3 Inagaki Hiroshi 66
#4 Kurosaka Shoei 66
#5 Nakamura Kozo 57
#6 Saishoji Toshiaki 53
#7 Kawashima Shigeki 45
#8 Yoshino Shiro 42
#9 Kotooka Toshirou 39
#10 Shiraishi Yutaka 37

Latest patents

Publication Filing date Title
WO2007040081A1 Single-crystal semiconductor fabrication device and fabrication method
WO2007004550A1 Method and apparatus for manufacturing semiconductor wafer
WO2007020744A1 Control system and method for time variant system control object having idle time such as single crystal producing device by czochralski method
JP2007027555A Method and device of evaluating semiconductor wafer accommodating container
JP2007027488A Method for polishing semiconductor wafer
JP2007021614A Polishing device and polishing head
TW200608490A Process for producing semiconductor substrate and semiconductor substrate
US2007184662A1 Double-side polishing carrier and fabrication method thereof
KR20070027631A Method of measuring concentration of impurity element
JP2006332281A Semiconductor wafer manufacturing method, semiconductor wafer double-sided grinding method, and semiconductor wafer double-sided grinding apparatus
JP2006305685A Wire saw device, guide bar for wire saw device and slurry supplying device for wire saw device
JP2006306640A Method for manufacturing silicon wafer
JP2006286874A Jig for heat treating wafer and heat treated wafer
JP2006273631A Method for manufacturing silicon single crystal, annealed wafer, and method for manufacturing annealed wafer
JP2006269960A Method of cleaning semiconductor substrate and method of manufacturing semiconductor substrate
JP2006266813A Melt collection tool, and ingot manufacturing device using melt collection tool
JP2006269582A Cleaning apparatus for work chuck, polishing device, cleaning method of work chuck, and manufacturing method of wafer
TW200534423A Semiconductor wafer inspection device and method
JP2006201027A Method for acquiring shape characteristics program, and recording medium
JP2006179831A Method of manufacturing epitaxial silicon wafer