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INT TEST SOLUTIONS INC

Overview
  • Total Patents
    67
  • GoodIP Patent Rank
    41,663
  • Filing trend
    ⇩ 66.0%
About

INT TEST SOLUTIONS INC has a total of 67 patent applications. It decreased the IP activity by 66.0%. Its first patent ever was published in 2000. It filed its patents most often in United States, Republic of Korea and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets chemical engineering, machine tools and semiconductors are PYUAREKKUSU KK, LEGACY SYSTEMS INC and MEGASONIC SWEEPING INC.

Patent filings per year

Chart showing INT TEST SOLUTIONS INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Humphrey Alan E 58
#2 Broz Jerry J 32
#3 Duvall James H 30
#4 Humphrey Bret A 26
#5 Smith Wayne C 11
#6 Broz Jerry 10
#7 Shivlal Janakraj 8
#8 Stark Mark M 7
#9 Humphrey Alan 6
#10 Freeze Billie Jean 4

Latest patents

Publication Filing date Title
WO2021003011A1 Pick and place machine cleaning system and method
US2021001378A1 Pick and place machine cleaning system and method
US2021005483A1 Pick and place machine cleaning system and method
US10792713B1 Pick and place machine cleaning system and method
US2021005499A1 Pick and place machine cleaning system and method
CA3090835A1 Novel material and hardware to automatically clean flexible electronic web rolls
PH12018550001A1 Semiconductor wire bonding machine cleaning device and method
US9825000B1 Semiconductor wire bonding machine cleaning device and method
CN105705258A Working surface cleaning system and method
US2014338698A1 Working surface cleaning system and method
TW201135818A Wafer manufacturing cleaning apparatus, process and method of use
KR20140028149A Wafer manufacturing cleaning apparatus, process and method of use
US2011132396A1 Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware
WO2005106511A1 Cleaning system, device and method
US6777966B1 Cleaning system, device and method
AU5759600A Probe device using superelastic probe elements