INT TEST SOLUTIONS INC has a total of 67 patent applications. It decreased the IP activity by 66.0%. Its first patent ever was published in 2000. It filed its patents most often in United States, Republic of Korea and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets chemical engineering, machine tools and semiconductors are PYUAREKKUSU KK, LEGACY SYSTEMS INC and MEGASONIC SWEEPING INC.
# | Country | Total Patents | |
---|---|---|---|
#1 | United States | 24 | |
#2 | Republic of Korea | 8 | |
#3 | WIPO (World Intellectual Property Organization) | 8 | |
#4 | China | 6 | |
#5 | EPO (European Patent Office) | 6 | |
#6 | Singapore | 3 | |
#7 | Taiwan | 3 | |
#8 | Australia | 2 | |
#9 | Canada | 2 | |
#10 | Philippines | 2 | |
#11 | Hong Kong | 1 | |
#12 | Japan | 1 | |
#13 | Malaysia | 1 |
# | Industry | |
---|---|---|
#1 | Chemical engineering | |
#2 | Machine tools | |
#3 | Semiconductors | |
#4 | Measurement | |
#5 | Surface technology and coating | |
#6 | Optics | |
#7 | Basic materials chemistry | |
#8 | Packaging and shipping |
# | Technology | |
---|---|---|
#1 | Cleaning | |
#2 | Semiconductor devices | |
#3 | Measuring electric variables | |
#4 | Grinding or polishing devices | |
#5 | Grinding tools | |
#6 | Soaps | |
#7 | Handling thin material | |
#8 | Layered products | |
#9 | Coating metallic material | |
#10 | Photomechanical semiconductor production |
# | Name | Total Patents |
---|---|---|
#1 | Humphrey Alan E | 58 |
#2 | Broz Jerry J | 32 |
#3 | Duvall James H | 30 |
#4 | Humphrey Bret A | 26 |
#5 | Smith Wayne C | 11 |
#6 | Broz Jerry | 10 |
#7 | Shivlal Janakraj | 8 |
#8 | Stark Mark M | 7 |
#9 | Humphrey Alan | 6 |
#10 | Freeze Billie Jean | 4 |
Publication | Filing date | Title |
---|---|---|
WO2021003011A1 | Pick and place machine cleaning system and method | |
US2021001378A1 | Pick and place machine cleaning system and method | |
US2021005483A1 | Pick and place machine cleaning system and method | |
US10792713B1 | Pick and place machine cleaning system and method | |
US2021005499A1 | Pick and place machine cleaning system and method | |
CA3090835A1 | Novel material and hardware to automatically clean flexible electronic web rolls | |
PH12018550001A1 | Semiconductor wire bonding machine cleaning device and method | |
US9825000B1 | Semiconductor wire bonding machine cleaning device and method | |
CN105705258A | Working surface cleaning system and method | |
US2014338698A1 | Working surface cleaning system and method | |
TW201135818A | Wafer manufacturing cleaning apparatus, process and method of use | |
KR20140028149A | Wafer manufacturing cleaning apparatus, process and method of use | |
US2011132396A1 | Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware | |
WO2005106511A1 | Cleaning system, device and method | |
US6777966B1 | Cleaning system, device and method | |
AU5759600A | Probe device using superelastic probe elements |