Learn more

HIDM SEMICONDUCTOR CO LTD

Overview
  • Total Patents
    33
  • GoodIP Patent Rank
    46,588
  • Filing trend
    ⇩ 100.0%
About

HIDM SEMICONDUCTOR CO LTD has a total of 33 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 2017. It filed its patents most often in China. Its main competitors in its focus markets semiconductors, audio-visual technology and optics are STRATIO INC, ITONAGA KAZUICHIRO and SUZUKI RYOJI.

Patent filings in countries

World map showing HIDM SEMICONDUCTOR CO LTDs patent filings in countries
# Country Total Patents
#1 China 33

Patent filings per year

Chart showing HIDM SEMICONDUCTOR CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Huang Rende 10
#2 Lin Zongxian 9
#3 Wu Longjiang 6
#4 Huang Xiaolu 5
#5 Wu Xiaozhe 5
#6 Li Zhiwei 5
#7 Zhang Cangwen 4
#8 Wang Huan 4
#9 Zhu Peng 4
#10 Lin Zongde 3

Latest patents

Publication Filing date Title
CN107948552A Imaging sensor and forming method thereof
CN107946336A Imaging sensor and forming method thereof
CN107829072A A kind of sputtering target material and device
CN107946239A Silicon through hole interconnection structure and forming method thereof
CN107946333A Imaging sensor and the method for forming imaging sensor
CN107946185A Wafer bonding method
CN107946332A Semiconductor structure, CMOS image sensor and preparation method thereof
CN107948470A Camera module and mobile equipment
CN107682649A Imaging sensor, electronic installation and its manufacture method
CN107942222A Tester table and test method
CN107946330A Imaging sensor and forming method thereof
CN107833901A Back side illumination image sensor and forming method thereof
CN107946191A Crystal column surface pattern control system and control method
CN107833900A Back-illuminated type cmos image sensor and its manufacture method
CN107819001A Imaging sensor and the method for forming imaging sensor
CN107863303A Defect inspection method
CN107863302A Test device and method of testing
CN107833841A Defect inspection method
CN107887401A Back side illumination image sensor and its manufacture method
CN107671725A Repair disc system, chemical mechanical polishing device and Ginding process