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GUANGDONG LEADYO IC TESTING CO LTD

Overview
  • Total Patents
    24
  • GoodIP Patent Rank
    68,007
  • Filing trend
    ⇧ 50.0%
About

GUANGDONG LEADYO IC TESTING CO LTD has a total of 24 patent applications. It increased the IP activity by 50.0%. Its first patent ever was published in 2015. It filed its patents most often in China. Its main competitors in its focus markets measurement, semiconductors and computer technology are ATECO INC, VOLTAFIELD TECH CORP and TAU METRIX INC.

Patent filings in countries

World map showing GUANGDONG LEADYO IC TESTING CO LTDs patent filings in countries
# Country Total Patents
#1 China 24

Patent filings per year

Chart showing GUANGDONG LEADYO IC TESTING CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Yuan Jun 17
#2 Zheng Zhaosheng 16
#3 Gu Shitao 16
#4 Zhang Yifeng 15
#5 Lu Xukun 13
#6 Jia Peng 7
#7 Chen Yong 6
#8 Wei Qiang 5
#9 Guo Dunfeng 5
#10 Zheng Ting 5

Latest patents

Publication Filing date Title
CN112082587A Chip gravity test tube-pouring auxiliary tool
CN111965521A Anti-reverse-insertion structure of test board for radio frequency chip and radio frequency chip testing device
CN111913096A Disassembly protection structure of wafer probe card, wafer test probe station and protection method
CN111924421A Automatic adjusting device for placing direction of chip material pipe
CN111913136A Method for detecting whether test bit and tester interface are connected in error or not and chip test system
CN111830396A Chip test system with chip test environment temperature detection function
CN111594718A Fixing device and chip test probe card
CN111564276A Magnetic field generation control device and magnetic field generation system with controllable magnetic flux
CN111323432A Chip appearance defect recognition device and method and chip testing system and method
CN111346845A Chip testing method and chip testing system
CN110911341A Wafer chuck, wafer testing equipment and wafer dotting method
CN111045978A Marking system and marking method
CN110940910A Carrying disc cooling system and wafer testing equipment
CN110850273A Material overlapping prevention IC test equipment and test method thereof
CN110435957A Integrated circuit surveys volume all-in-one machine from carrier band is moved
CN110487159A For loading the warpage detection device and its detection method of the Tray disk of IC
CN110504180A A kind of test of infrared receiver chip trims system
CN110488175A Fingerprint chip testing component, method and computer readable storage medium
CN109216247A Wafer separating system and its sharding method
CN109216239A Wafer cleaning equipment and cleaning method