| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 11 | |
| #2 | Japan | 4 | |
| #3 | China | 2 | |
| #4 | Republic of Korea | 2 | |
| #5 | WIPO (World Intellectual Property Organization) | 2 | |
| #6 | EPO (European Patent Office) | 1 | |
| #7 | Taiwan | 1 |
| # | Industry | |
|---|---|---|
| #1 | Semiconductors | |
| #2 | Measurement |
| # | Technology | |
|---|---|---|
| #1 | Semiconductor devices | |
| #2 | Measuring electric variables |
| # | Name | Total Patents |
|---|---|---|
| #1 | Aghababazadeh Majid | 20 |
| #2 | Steinbrueck Gary L | 17 |
| #3 | Vickers James S | 15 |
| #4 | Estabil Jose J | 13 |
| #5 | Pakdaman Nader | 11 |
| #6 | Pelella Mario M | 7 |
| #7 | Pakdaman Nadar | 5 |
| #8 | Vickers James B | 3 |
| #9 | Majid Aghababazadeh | 3 |
| #10 | Steinbrueck Gary | 2 |
| Publication | Filing date | Title |
|---|---|---|
| WO2010025391A2 | Integrated photodiode for semiconductor substrates | |
| CN101556930A | Technique for evaluating a fabrication of a semiconductor component and wafer | |
| WO2005020297A2 | Technique for evaluating a fabrication of a semiconductor component and wafer |