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GEN NANOTECHNOLOGY LLC

Overview
  • Total Patents
    54
About

GEN NANOTECHNOLOGY LLC has a total of 54 patent applications. Its first patent ever was published in 1995. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and EPO (European Patent Office). Its main competitors in its focus markets machines, measurement and optics are KLEY VICTOR B, FUJIHIRA MASAMICHI and OHARA TETSUO.

Patent filings per year

Chart showing GEN NANOTECHNOLOGY LLCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kley Victor B 50
#2 Kley Vic B 4
#3 Lobianco Robert T 1

Latest patents

Publication Filing date Title
US2008315092A1 Scanning probe microscopy inspection and modification system
US2008202221A1 Methods and apparatus for nanolapping
WO2007037994A2 Manufacturing of micro-objects such as miniature diamond tool tips
US7253407B1 Active cantilever for nanomachining and metrology
WO2006088444A1 Manufacturing of micro-objects such as minuature diamond tool tips
WO2004023490A2 Fluid delivery for scanning probe microscopy
US2005115047A1 Manufacturing of micro-objects such as miniature diamond tool tips
US2003167831A1 Method and apparatus for micromachines, microstructures, nanomachines and nanostructures
US7196328B1 Nanomachining method and apparatus
US6752008B1 Method and apparatus for scanning in scanning probe microscopy and presenting results
US6802646B1 Low-friction moving interfaces in micromachines and nanomachines
US6923044B1 Active cantilever for nanomachining and metrology
US6787768B1 Method and apparatus for tool and tip design for nanomachining and measurement
US6861648B2 Scanning probe microscopy inspection and modification system
US6507553B2 Nanometer scale data storage device and associated positioning system
EP1196939A1 Object inspection and/or modification system and method
US6724712B2 Nanometer scale data storage device and associated positioning system
US6339217B1 Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements