Learn more

FUJIMURA AKIRA

Overview
  • Total Patents
    26
About

FUJIMURA AKIRA has a total of 26 patent applications. Its first patent ever was published in 2007. It filed its patents most often in United States. Its main competitors in its focus markets optics, electrical machinery and energy and machines are D2S INC, ASELTA NANOGRAPHICS and NIPPON CONTROL SYS CORP.

Patent filings in countries

World map showing FUJIMURA AKIRAs patent filings in countries
# Country Total Patents
#1 United States 26

Patent filings per year

Chart showing FUJIMURA AKIRAs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Fujimura Akira 26
#2 Tucker Michael 5
#3 Bork Ingo 5
#4 Glasser Lance 4
#5 Zable Harold Robert 4
#6 Meier Stephen F 3
#7 Hagiwara Kazuyuki 3
#8 Komori Kazuo 2
#9 Jacques Etienne 2
#10 Kubota Kazunori 2

Latest patents

Publication Filing date Title
US2013205264A1 Method and system for forming high precision patterns using charged particle beam lithography
US2012217421A1 Method and system for forming patterns using charged particle beam lithography with overlapping shots
US2012219886A1 Method and system for forming patterns using charged particle beam lithography with variable pattern dosage
US2012064440A1 Method for design and manufacture of diagonal patterns with variable shaped beam lithography
US2013070222A1 Method and System for Optimization of an Image on a Substrate to be Manufactured Using Optical Lithography
US2012329289A1 Method and system for forming patterns with charged particle beam lithography
US2012096412A1 Method and system for forming high accuracy patterns using charged particle beam lithography
US2011252386A1 Method for optical proximity correction of a reticle to be manufactured using variable shaped beam lithography
US2012221980A1 Method and system for design of enhanced accuracy patterns for charged particle beam lithography
US2012221985A1 Method and system for design of a surface to be manufactured using charged particle beam lithography
US2012221981A1 Method and system for design of enhanced edge slope patterns for charged particle beam lithography
US2011045409A1 Method and system for manufacturing a surface using character projection lithography with variable magnification
US2011278731A1 Method for integrated circuit design and manufacture using diagonal minimum-width patterns
US2010055586A1 Method and system for forming circular patterns on a surface