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FORTUNE SEMICONDUCTOR CORP

Overview
  • Total Patents
    51
  • GoodIP Patent Rank
    237,208
  • Filing trend
    ⇩ 100.0%
About

FORTUNE SEMICONDUCTOR CORP has a total of 51 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 2004. It filed its patents most often in Taiwan, China and United States. Its main competitors in its focus markets measurement, computer technology and semiconductors are X FAB SEMICONDUCTOR FOUNDRIES GMBH, HITACHI ULSI SYS CO LTD and HWANG SUNG-MIN.

Patent filings in countries

World map showing FORTUNE SEMICONDUCTOR CORPs patent filings in countries
# Country Total Patents
#1 Taiwan 23
#2 China 13
#3 United States 11
#4 Germany 2
#5 Japan 2

Patent filings per year

Chart showing FORTUNE SEMICONDUCTOR CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Chen Yen-Yi 9
#2 Chen Kuo-Chiang 9
#3 Guoqiang Chen 7
#4 Yuan Kuo-Yuan 7
#5 Yanyi Chen 7
#6 Yu Tsai-Chung 5
#7 Huang Yi-Zhou 4
#8 Wu Xiao-Long 4
#9 Lin Hsiang-Min 3
#10 Rong Arthur Shaoyan 3

Latest patents

Publication Filing date Title
TW201917978A A device and a method of switches for charging and discharging lithium battery
TW201310594A Packaging structure
TW201310585A Packaging structure
TW201225529A Test mode controller and electronic apparatus with self-testing thereof
TW201214923A Polarity switch circuit in charger
TW201213825A Circuit apparatus
TW201209997A Layout of power MOSFET
TW201208036A A multi-chip module
TW201113974A Semiconductor chip, seal-ring structure and the manufacturing process thereof
TW201113977A Semiconductor chip, seal-ring structure and the manufacturing process thereof
DE102008001112A1 Temperature sensor for a circuit for controlling the charging and discharging processes of a battery
TW200936996A Temperature sensing module
US2008046219A1 Integrated circuit with self-proofreading function and measuring device using the same
US2008046182A1 Integrated circuit with self-proofreading function, measuring device using the same and method for self-recording parameter
US2008043508A1 Method for programming one-time programmable memory of integrated circuit
CN1992085A Fuse trimming circuit and method of operation
TWI269306B One-time programmable memory and its data recording method
US2007005289A1 Temperature compensation apparatus for electronic signal
TW200625758A Undervoltage protection device of coil driving device
TW200615542A Digital electronic energy measuring device and method thereof