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CHUNGHWA PREC TEST TECH CO LTD

Overview
  • Total Patents
    82
  • GoodIP Patent Rank
    19,200
  • Filing trend
    ⇩ 31.0%
About

CHUNGHWA PREC TEST TECH CO LTD has a total of 82 patent applications. It decreased the IP activity by 31.0%. Its first patent ever was published in 2007. It filed its patents most often in China, United States and Taiwan. Its main competitors in its focus markets measurement, audio-visual technology and semiconductors are ELES SEMICONDUCTOR EQUIPMENT S P A, LOU CHOON LEONG and RADIO CONTROLE SA.

Patent filings in countries

World map showing CHUNGHWA PREC TEST TECH CO LTDs patent filings in countries
# Country Total Patents
#1 China 35
#2 United States 33
#3 Taiwan 6
#4 Japan 5
#5 Republic of Korea 3

Patent filings per year

Chart showing CHUNGHWA PREC TEST TECH CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Hsieh Kai Chieh 18
#2 Su Wei-Jhih 17
#3 Hsieh Chih-Peng 16
#4 Hsieh Kai-Chieh 13
#5 Su Weizhi 12
#6 Xie Zhipeng 12
#7 Lee Wen-Tsung 12
#8 Li Wen Tsung 11
#9 Li Wencong 8
#10 Xie Kaijie 7

Latest patents

Publication Filing date Title
CN110927416A Probe card testing device and testing device
CN110824207A Radio frequency probe card device and interval conversion plate thereof
CN110470872A Guide plate and its manufacturing method and probe with the guide plate
CN110389243A Probe card device and its rectangular probe
CN110389241A Probe base and its rectangular probe
CN110196343A Probe assembly and its probe structure
CN110196344A Probe assembly and its probe structure
CN110118883A Probe card device and its signal Transmission Part
CN110068711A Probe card device and rectangular probe
US2019072586A1 Probe assembly and probe structure thereof
CN110018334A Probe card device and its rectangular probe
CN109839522A Probe card device and its signal converting module
CN109839521A Probe card device and its signal transmission module
CN109752573A Probe assembly and its tenon joint type capacitance probe
CN109752576A probe card device and its signal transmission module
CN109298208A The integrated circuit test seat of integrated signal and Power Integrity module
CN108933041A Thin-film capacitor and its manufacturing method
CN108957057A Probe and its manufacturing method for probe card
CN109669059A Adjust the circuit structure and its semiconductor test interface system of power supply signal impedance
CN109581003A Probe assembly and its capacitor probe