| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Taiwan | 8 | |
| #2 | China | 4 | |
| #3 | United States | 3 | |
| #4 | Japan | 2 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Telecommunications | |
| #3 | Computer technology | |
| #4 | Audio-visual technology | |
| #5 | Environmental technology |
| # | Name | Total Patents |
|---|---|---|
| #1 | Wang Yen-Chun | 8 |
| #2 | Chu Chen-Kuo | 6 |
| #3 | Huang Hung-Jen | 6 |
| #4 | Liu I-Chun | 6 |
| #5 | Sun Chun-Hung | 5 |
| #6 | Liu Yi-Ting | 3 |
| #7 | Mao Zi-Ning | 1 |
| #8 | Mao Zi Ning | 1 |
| #9 | Tsai Sheng-Feng | 1 |
| #10 | Cheng Mao-Chuan | 1 |
| Publication | Filing date | Title |
|---|---|---|
| US2020386802A1 | Antenna testing module and method for operating the same | |
| US2020355738A1 | Apparatus and method of testing electronic components | |
| TWI681357B | Device and method for substrate defects analyzation | |
| TW201823743A | System and method for testing semiconductor elements | |
| TW201818080A | Ic test socket and method for determining esd decay time capability of ic test socket |