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JORDAN VALLEY APPLIED RADIATION LTD

Overview
  • Total Patents
    70
About

JORDAN VALLEY APPLIED RADIATION LTD has a total of 70 patent applications. Its first patent ever was published in 1997. It filed its patents most often in United States, Taiwan and Japan. Its main competitors in its focus markets measurement, semiconductors and electrical machinery and energy are RIGAKU DENKI KOGYO KK, BOHLIN LEIF RUNE and MATSUZAWA SEIKI KK.

Patent filings per year

Chart showing JORDAN VALLEY APPLIED RADIATION LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Yokhin Boris 54
#2 Mazor Isaac 52
#3 Gvirtzman Amos 30
#4 Berman David 19
#5 Rafaeli Tzachi 14
#6 Dikopoltsev Alex 8
#7 Vu Long 8
#8 Dikopoltsev Alexander 8
#9 Dovrat Ami 4
#10 Agnihotri Dileep 4

Latest patents

Publication Filing date Title
US2007224518A1 Overlay metrology using X-rays
KR20060051491A Multifunction x-ray analysis system
US7113566B1 Enhancing resolution of X-ray measurements by sample motion
US2006227931A1 Detection of dishing and tilting using X-ray fluorescence
US2006188062A1 Material analysis using multiple X-ray reflectometry models
US2006133570A1 Measurement of critical dimensions using X-ray diffraction in reflection mode
US2006115047A1 X-ray apparatus with dual monochromators
US2006115046A1 Calibration of X-ray reflectometry system
JP2005140771A Method and device for inspecting sample
US2006062350A1 Combined X-ray reflectometer and diffractometer
US2006023836A1 Enhancement of X-ray reflectometry by measurement of diffuse reflections
US7035375B2 X-ray scattering with a polychromatic source
US2004131151A1 X-ray reflectometry of thin film layers with enhanced accuracy
US2005069090A1 Optical alignment of X-ray microanalyzers
US2004156474A1 X-ray reflectometry with small-angle scattering measurement
US6947520B2 Beam centering and angle calibration for X-ray reflectometry
US2003156682A1 Dual-wavelength X-ray reflectometry
US6535575B2 Pulsed X-ray reflectometer
US6512814B2 X-ray reflectometer
TWI225760B Apparatus and method for X-ray analysis of a sample, and radiation detection apparatus