| # | Country | Total Patents | |
|---|---|---|---|
| #1 | China | 3 | |
| #2 | Republic of Korea | 2 | |
| #3 | Malaysia | 2 | |
| #4 | Taiwan | 2 | |
| #5 | WIPO (World Intellectual Property Organization) | 2 | |
| #6 | Singapore | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Environmental technology | |
| #3 | Semiconductors | |
| #4 | Audio-visual technology |
| # | Technology | |
|---|---|---|
| #1 | Analysing materials | |
| #2 | Reduction of greenhouse gas emissions | |
| #3 | Semiconductor devices | |
| #4 | Measuring electric variables | |
| #5 | Television | |
| #6 | Photovoltaic modules |
| # | Name | Total Patents |
|---|---|---|
| #1 | Chan Sok Leng | 6 |
| #2 | Han Peh Kwan | 3 |
| #3 | Leng Chan Sok | 3 |
| Publication | Filing date | Title |
|---|---|---|
| SG10201508830PA | Method and system to detect chippings on solar wafer | |
| CN102113106A | Apparatus for detecting micro-cracks in wafers and method therefor | |
| KR20110058742A | Method and system for detecting micro-cracks in wafers |