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BT IMAGING PTY LTD

Overview
  • Total Patents
    98
  • GoodIP Patent Rank
    87,448
  • Filing trend
    ⇩ 33.0%
About

BT IMAGING PTY LTD has a total of 98 patent applications. It decreased the IP activity by 33.0%. Its first patent ever was published in 2006. It filed its patents most often in China, WIPO (World Intellectual Property Organization) and United States. Its main competitors in its focus markets measurement, environmental technology and semiconductors are NIPPON ELECTRO SENSARI DEVICE, CHONGQING FUTURE INNOVATION VISION TECH CO LTD and SHANGHAI YUWEITEK SEMICONDUCTOR TECH CO LTD.

Patent filings per year

Chart showing BT IMAGING PTY LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Trupke Thorsten 78
#2 Bardos Robert Andrew 49
#3 Maxwell Ian Andrew 31
#4 Weber Juergen 29
#5 Bardos Robert A 10
#6 Thorsten Trupke 8
#7 Andrew Bardos Robert 6
#8 Andrew Maxwell Ian 5
#9 Mcmillan Wayne 4
#10 Arnett Kenneth Edmund 4

Latest patents

Publication Filing date Title
TW201834382A System and method able to determine a condition of a photovoltaic module over time and related media
TW201834381A Apparatus and method for inspecting a photovoltaic module
US2018159468A1 Determining the condition of photovoltaic modules
WO2018098516A1 Determining the condition of photovoltaic modules
US2018159469A1 Determining the condition of photovoltaic modules
CN109387494A Check the method for semiconductor material and the method and system of analysis semiconductor material
EP2801107A1 Wafer grading and sorting for photovoltaic cell manufacture
CN103874918A Photoluminescence imaging of doping variations in semiconductor wafers
CN103477208A Quantitative series resistance imaging of photovoltaic cells
WO2012027788A1 Systems and methods for detecting crystal defects in monocrystalline semiconductors
AU2011211343A1 Luminescence Module Inspection
CN103210482A Persistent feature detection
WO2011120089A1 Control of laser processing steps in solar cell manufacture
CN105717085A System And Method For Anlysis Of Semiconductor Material Samples
WO2011017776A1 Photoluminescence imaging of surface textured wafers
CN102575986A Photoluminescence imaging systems for silicon photovoltaic cell manufacturing
CN102575993A Detection of discontinuities in semiconductor materials
CN104020148A Separation of doping density and minority carrier lifetime in photoluminescence measurement
WO2010130013A1 Material or device characterisation with non-homogeneous photoexcitation
CN102144284A Method and apparatus for defect detection