| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Taiwan | 5 | |
| #2 | United States | 3 | |
| #3 | WIPO (World Intellectual Property Organization) | 3 | |
| #4 | China | 2 | |
| #5 | Germany | 2 | |
| #6 | Republic of Korea | 2 | |
| #7 | Australia | 1 | |
| #8 | EPO (European Patent Office) | 1 |
| # | Industry | |
|---|---|---|
| #1 | Audio-visual technology | |
| #2 | Measurement | |
| #3 | Electrical machinery and energy | |
| #4 | Optics | |
| #5 | Surface technology and coating |
| # | Technology | |
|---|---|---|
| #1 | Display controls | |
| #2 | Measuring electric variables | |
| #3 | Electric discharge tubes | |
| #4 | Nonlinear optics | |
| #5 | Coating metallic material |
| # | Name | Total Patents |
|---|---|---|
| #1 | Brunner Matthias | 14 |
| #2 | Schmid Ralf | 7 |
| #3 | Mueller Bernhard | 4 |
| #4 | Mueller Bernhard Gunter | 3 |
| #5 | Wenzel Axel | 2 |
| #6 | Matthias Brunner | 2 |
| #7 | Sauer Andreas | 1 |
| #8 | Ralf Schmid | 1 |
| #9 | Heimel Oliver | 1 |
| #10 | Brunner Matthias Dr | 1 |
| Publication | Filing date | Title |
|---|---|---|
| TW200745530A | Device and method for testing an optoelectronic module | |
| TWI290623B | Method for beam calibration and usage of a calibration body | |
| DE102005000813A1 | Method for beam calibration and uses of a calibration body | |
| DE10253717A1 | Device for contacting for the test of at least one test object, test system and method for testing test objects |