ACT ADVANCED CIRCUIT TESTING has a total of 15 patent applications. Its first patent ever was published in 1994. It filed its patents most often in United States, Japan and EPO (European Patent Office). Its main competitors in its focus markets electrical machinery and energy, semiconductors and surface technology and coating are SEN CORP, ADVANCED ION BEAM TECHNOLOGY I and SUMITOMO HEAVY INDUSTRIES ION TECHNOLOGY CO LTD.
# | Country | Total Patents | |
---|---|---|---|
#1 | United States | 7 | |
#2 | Japan | 5 | |
#3 | EPO (European Patent Office) | 2 | |
#4 | Germany | 1 |
# | Industry | |
---|---|---|
#1 | Electrical machinery and energy | |
#2 | Semiconductors | |
#3 | Surface technology and coating |
# | Technology | |
---|---|---|
#1 | Electric discharge tubes | |
#2 | Semiconductor devices | |
#3 | Coating metallic material |
# | Name | Total Patents |
---|---|---|
#1 | Frosien Juergen | 6 |
#2 | Frosien Juergen Dr | 6 |
#3 | Ueda Koshi | 4 |
#4 | Schmitt Reinhold | 4 |
#5 | Iwai Toshimichi | 4 |
#6 | Spehr Rainer Dr | 3 |
#7 | Schoenecker Gerald Dr | 3 |
#8 | Schmitt Michael Dipl-Phys | 3 |
#9 | Schoenecker Gerald | 3 |
#10 | Lanio Stefan | 2 |
Publication | Filing date | Title |
---|---|---|
US5780859A | Electrostatic-magnetic lens arrangement | |
EP0834896A1 | Apparatus for generating an electron beam | |
EP0821393A1 | Detector objective lens | |
DE19605855A1 | Detector lens for corpuscular beam devices |