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ZHONGDAO OPTOELECTRONIC EQUIPMENT CO LTD

Overview
  • Total Patents
    18
  • GoodIP Patent Rank
    93,921
  • Filing trend
    0.0%
About

ZHONGDAO OPTOELECTRONIC EQUIPMENT CO LTD has a total of 18 patent applications. It increased the IP activity by 0.0%. Its first patent ever was published in 2016. It filed its patents most often in China. Its main competitors in its focus markets measurement, computer technology and optics are HUIZHOU GOVION TECH CO LTD, DONGGUAN AIVISIONLAB INTELLIGENT VISUAL SENSE TECH CO LTD and SHENZHEN ZVIT TECH CO LTD.

Patent filings in countries

World map showing ZHONGDAO OPTOELECTRONIC EQUIPMENT CO LTDs patent filings in countries
# Country Total Patents
#1 China 18

Patent filings per year

Chart showing ZHONGDAO OPTOELECTRONIC EQUIPMENT CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Li Bo 12
#2 Yang Yilu 5
#3 Zuo Youxiang 5
#4 Zhang Liang 4
#5 Zha Shihua 3
#6 Zhang Guodong 3
#7 Guan Yuping 2
#8 Chen Kun 2
#9 Zhang Hu 2
#10 Wang Jiancun 2

Latest patents

Publication Filing date Title
CN111338051A Automatic focusing method and system based on TFT liquid crystal panel
CN111508017A Method and system for positioning mark center with weak contrast
CN110874837A Automatic defect detection method based on local feature distribution
CN110420865A ULED screen substrate detection/backlight of measuring device detects/measures objective table
CN110420864A A kind of ULED screen substrate detection/measuring device and its application method
CN110320686A ULED screen substrate detection/measuring device pre- alignment device and its application method
CN110186930A A kind of optical imagery detection method and equipment
CN110208289A Automatic top type tracking focusing system and method based on image definition
CN110132982A A kind of automatic optical detection method and equipment of high sensitivity
CN110187530A A kind of liquid crystal display panel dynamic adjusting device
CN110189245A Image detecting method and system based on GPUDirect technology
CN110132999A A kind of imaging system and method detecting FPD substrate
CN110175992A The detection method and system of macroscopic view mura defect on large scale liquid crystal panel
CN110208284A A kind of method and system of multichannel defect combined analysis
CN109781736A A kind of method for automatic measurement and system in wafer texture image period
CN109035230A A kind of Circularhole diameter vision measuring method
CN109916918A A kind of device and method detecting plate cleannes and flatness
CN106081627A A kind of high-speed air floatation plate and using method thereof