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SHENZHEN ZVIT TECH CO LTD

Overview
  • Total Patents
    20
  • GoodIP Patent Rank
    81,086
About

SHENZHEN ZVIT TECH CO LTD has a total of 20 patent applications. Its first patent ever was published in 2019. It filed its patents most often in China. Its main competitors in its focus markets computer technology, measurement and audio-visual technology are LUDESI AB, SVXR INC and SHENZHEN XIANGXINGZI TECH CO LTD.

Patent filings in countries

World map showing SHENZHEN ZVIT TECH CO LTDs patent filings in countries
# Country Total Patents
#1 China 20

Patent filings per year

Chart showing SHENZHEN ZVIT TECH CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Zhang Meng 13
#2 Wang Shuangqiao 10
#3 Pang Fengjiang 9
#4 Wu Xiaofei 7
#5 Zhang Fan 5
#6 Zhou Kai 5
#7 Zeng Jiangdong 3
#8 Peng Qidong 3
#9 Liao Fangcheng 3
#10 Wang Siping 2

Latest patents

Publication Filing date Title
CN111815632A Visual inspection method and device for sewing stitches
CN111724372A Method, terminal and storage medium for detecting cloth defects based on antagonistic neural network
CN111401485A Practical texture classification method
CN111337512A Defect extraction method for AOI defect detection
CN111339220A Defect mapping method
CN111337433A Defect layering device and method for surface defect detection
CN111398301A Optical imaging method for automatically detecting defects of glass cover plate
CN111398300A Imaging method for detecting defects of glass cover plate
CN110728659A Defect merging method and device, computer equipment and storage medium
CN110618141A Method, system and device for detecting glass defects
CN110738237A Defect classification method and device, computer equipment and storage medium
CN110579490A Sheet appearance defect detection device and method
CN110717889A Defect detection method and device based on digital printing, terminal and readable medium
CN110596120A Glass boundary defect detection method, device, terminal and storage medium
CN110738606A Image correction method, device, terminal and storage medium for multi-light source system
CN110751623A Joint feature-based defect detection method, device, equipment and storage medium
CN110232681A Fault methods of exhibiting, device, computer equipment and storage medium
CN110263668A Back method, system, terminal and the readable medium of detection data
CN110223277A Method, apparatus, terminal device and the storage medium that image generates
CN110223309A Edge detection method, device, computer equipment and storage medium