| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 12 | |
| #2 | WIPO (World Intellectual Property Organization) | 9 | |
| #3 | Taiwan | 2 |
| # | Industry | |
|---|---|---|
| #1 | Computer technology | |
| #2 | Measurement | |
| #3 | Semiconductors | |
| #4 | Audio-visual technology | |
| #5 | Control | |
| #6 | Engines, pumps and turbines |
| # | Name | Total Patents |
|---|---|---|
| #1 | Ratner Edward R | 9 |
| #2 | Adler David Lewis | 9 |
| #3 | Jewler Scott Joseph | 6 |
| #4 | Babian Freddie Erich | 6 |
| #5 | Adler David | 5 |
| #6 | Jewler Scott | 4 |
| #7 | Adler David L | 4 |
| #8 | Reid Andrew George | 3 |
| #9 | Babian Freddie | 3 |
| #10 | Hu Renjie | 2 |
| Publication | Filing date | Title |
|---|---|---|
| US2021012054A1 | Methods and Systems for Printed Circuit Board Design Based on Automatic Corrections | |
| US2020380664A1 | Method and apparatus for rapid inspection of subcomponents of manufactured component | |
| US2020380654A1 | Method and apparatus for rapidly classifying defects in subcomponents of manufactured component | |
| US2020013145A1 | Super-resolution X-ray imaging method and apparatus | |
| US2016351283A1 | High speed X-ray microscope |