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WIPAM INC

Overview
  • Total Patents
    29
  • GoodIP Patent Rank
    180,211
  • Filing trend
    0.0%
About

WIPAM INC has a total of 29 patent applications. It increased the IP activity by 0.0%. Its first patent ever was published in 2006. It filed its patents most often in Republic of Korea, China and Taiwan. Its main competitors in its focus markets basic communication technologies, semiconductors and measurement are BLACK SAND TECHNOLOGIES INC, RFAXIS INC and ELANTEC INC.

Patent filings per year

Chart showing WIPAM INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Yu Dae Kyu 18
#2 Eo Yung Seon 12
#3 Yu Daekyu 9
#4 Min Kyoung Joon 6
#5 Kim Hye Won 4
#6 Ji Gi Hyeon 3
#7 Kim Dong Chul 2
#8 Lee Min Ji 1
#9 Shin Jung Geun 1
#10 Kim Joon Hyun 1

Latest patents

Publication Filing date Title
KR20200081972A Multilayered SAW resonator to minimize energy leakage and manufacturing method thereof
KR20200081815A SAW resonator to enhance Q-factor and manufacturing method thereof
KR20180098767A Crosstalk Noise Suppression Method in Multi-Coupled High-Speed Data Link
KR101879278B1 SAW phase velocity extraction method for the SAW filter design
KR20170097395A The method of characterization technique of 4-port coupled lines
KR101680473B1 The method of high-frequency S-parameter measurement for planar components
KR101613035B1 The method of frequency-variant material constant determination for multi-layered mixed-dielectric material in thin-film structure
KR20150054388A Transmission line design method with lossy and crosstalk characterstics
KR101393423B1 Frequency-variant transmission line parameter determination method using frequency-variant complex permittivity
KR101348960B1 The method of determination of the resonance-effect-free frequency variant transmission line parameters
KR20130078245A Input signal determinant method for the eye-diagram
KR101214369B1 Chip synchronizing by using enable signal and method for synchronizing
KR101219439B1 Pre-emphasis circuit
KR101240561B1 Method for extracting circuit model parameter and computer readable recording medium
KR20110042901A The method for manufacturing measurable via test patterns and characterization of via in multi-layered ic package
KR20090020088A A layout structure for reducing an interference phenomenon
KR100862056B1 Broadband power amplifier
KR100749870B1 Doherty amplifier