VG SYSTEMS LTD has a total of 20 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 1997. It filed its patents most often in United Kingdom, United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, electrical machinery and energy and audio-visual technology are APPLIED RES LAB INC, KRATOS LTD and TOFWERK AG.
# | Country | Total Patents | |
---|---|---|---|
#1 | United Kingdom | 9 | |
#2 | United States | 4 | |
#3 | WIPO (World Intellectual Property Organization) | 3 | |
#4 | Germany | 2 | |
#5 | EPO (European Patent Office) | 2 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Electrical machinery and energy | |
#3 | Audio-visual technology | |
#4 | Optics |
# | Technology | |
---|---|---|
#1 | Analysing materials | |
#2 | Electric discharge tubes | |
#3 | Measuring nuclear radiation | |
#4 | Television | |
#5 | Measuring light | |
#6 | Optical systems |
# | Name | Total Patents |
---|---|---|
#1 | Barnard Bryan | 6 |
#2 | Hibbard Noah | 3 |
#3 | Glenister Christopher Kenneth | 3 |
#4 | Nunney Timothy Sion | 3 |
#5 | Meyer Matthew Wayne | 3 |
#6 | Pesic Zoran | 2 |
#7 | Stephens Chris | 2 |
#8 | Day Austin | 2 |
#9 | Coxon Peter | 2 |
#10 | Day Austin Penrose | 2 |
Publication | Filing date | Title |
---|---|---|
GB201916226D0 | Charged particle detection for spectroscopic techniques | |
GB201910880D0 | A spectroscopy and imaging system | |
EP3705877A1 | Methods and apparatus for electron backscatter diffraction sample characterisation | |
EP3423813A2 | Xps and raman sample analysis system and method | |
GB201621105D0 | Image capture assembly and method for electron back scatter diffraction | |
GB201017173D0 | Improvements in and relating to ion guns | |
GB0912332D0 | Magnetic lens,method for focussing charged particles and charged particle energy analyser | |
GB9718012D0 | A spectrometer and method of spectroscopy |