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HITACHI HIGH TECH SCIENCE CORP

Overview
  • Total Patents
    722
  • GoodIP Patent Rank
    2,558
  • Filing trend
    ⇧ 85.0%
About

HITACHI HIGH TECH SCIENCE CORP has a total of 722 patent applications. It increased the IP activity by 85.0%. Its first patent ever was published in 2002. It filed its patents most often in Japan, United States and China. Its main competitors in its focus markets measurement, electrical machinery and energy and optics are MOBILION SYSTEMS INC, IONSENSE INC and BRUKER AXS KK.

Patent filings per year

Chart showing HITACHI HIGH TECH SCIENCE CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Asahata Tatsuya 134
#2 Uemoto Atsushi 79
#3 Sato Makoto 66
#4 Sugiyama Yasuhiko 52
#5 Man Xin 52
#6 Suzuki Hidekazu 49
#7 Oba Hiroshi 44
#8 Tomimatsu Satoshi 40
#9 Matsuda Osamu 35
#10 Sakuta Masahiro 35

Latest patents

Publication Filing date Title
DE102020127344A1 DEVICE WITH FOCUSED ION BEAM AND CONTROL PROCEDURE FOR DEVICE WITH FOCUSED ION BEAM
US2021118645A1 Charged particle beam apparatus, composite charged particle beam apparatus, and control method for charged particle beam apparatus
DE102020212010A1 CARRIER JET DEVICE
DE102020211900A1 CARRIER JET DEVICE
US2021090849A1 Focused ion beam apparatus
US2021090854A1 Focused ion beam apparatus
DE102020211737A1 RADIATION DEVICE WITH CHARGED PARTICLE JET AND CONTROL PROCEDURE
DE102020211687A1 LIQUID METAL ION SOURCE AND DEVICE WITH FOCUSED ION BEAM
DE102020211688A1 PARTICLE BEAM IRRADIATION DEVICE
DE102020211686A1 SAMPLE HOLDER AND CHARGE CARRIER BLAST DEVICE
US2021063242A1 Method of obtaining quantum efficiency distribution, method of displaying quantum efficiency distribution, program for obtaining quantum efficiency distribution, program for displaying quantum efficiency distribution, fluorescence spectrophotometer, and display device
DE102020208670A1 Autosampler control as well as automatic measuring system, which it includes
DE102020208623A1 Liquid chromatograph device
DE102020208624A1 Analysis device
DE102020114535A1 THERMAL ANALYZER
JP2020126852A Charged particle beam device
JP2021001870A Thermal analyzer
JP2020013801A Ion beam device
JP2019212636A Composite charged particle beam device
DE102019212756A1 Chromatography equipment