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APPLIED RES LAB INC

Overview
  • Total Patents
    43
About

APPLIED RES LAB INC has a total of 43 patent applications. Its first patent ever was published in 1956. It filed its patents most often in Germany, United Kingdom and United States. Its main competitors in its focus markets measurement, electrical machinery and energy and machines are HITACHI HIGH TECH SCIENCE CORP, MOBILION SYSTEMS INC and IONSENSE INC.

Patent filings in countries

World map showing APPLIED RES LAB INCs patent filings in countries
# Country Total Patents
#1 Germany 14
#2 United Kingdom 13
#3 United States 10
#4 France 5
#5 Spain 1

Patent filings per year

Chart showing APPLIED RES LAB INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Hasler Maurice F 3
#2 Hermann Neuhaus 3
#3 Jakob Liebl Helmut 2
#4 Neuhaus Hermann 2
#5 A Andersen Christian 2
#6 J Liebl Helmut 2
#7 Canada Neuhaus Herman La 1
#8 Latimer Jones James 1
#9 H Smallbone Allan 1
#10 L Dahlquist Ralph 1

Latest patents

Publication Filing date Title
DE1919880A1 Method for operating an ion probe
GB1213534A Analysis by bombardment with a beam of chemically reactive ions
DE1773598A1 Method and device for producing an aerosol
GB1159905A X-Ray Generating Apparatus.
GB1145108A Apparatus for dispersing charged particles
GB1129690A Magnetic sector lens
DE1472062A1 Drive for spectrometer or the like.
US3384756A Peaked monochromator having a sharply blazed diffraction grating which is always operated at the peak of the blaze
US3388427A Apparatus for preparing samples for X-ray analysis
US3351755A Method of and apparatus for spectroscopic analysis having compensating means for uncontrollable variables
US3346737A Hydraulically controllable spectroscopic slit apparatus for making precision adjustments of the slit width
US3346736A Electron probe apparatus having an objective lens with an aperture for restricting fluid flow
GB948673A X-ray diffraction apparatus
US3116415A Mechanical motion and spectrographic device including it
US3153144A Position adjustment mechanism and X-ray spectrometer including it
US3107297A Electron probe X-ray analyzer wherein the emitted X-radiation passes through the objective lens
ES253429A1 Obstacle device for devices operating in the vacuum (Machine-translation by Google Translate, not legally binding)
US2897371A Spectroscopy
US2897367A Spectroscopy