Learn more

TESCAN BRNO S R O

Overview
  • Total Patents
    38
  • GoodIP Patent Rank
    40,575
  • Filing trend
    ⇩ 28.0%
About

TESCAN BRNO S R O has a total of 38 patent applications. It decreased the IP activity by 28.0%. Its first patent ever was published in 2015. It filed its patents most often in United States, Czechia and EPO (European Patent Office). Its main competitors in its focus markets electrical machinery and energy, measurement and semiconductors are SUMITOMO HEAVY IND ION TECH CO LTD, VALUE ENG LTD and NISSIN ION EQUIPMENT CO LTD.

Patent filings per year

Chart showing TESCAN BRNO S R Os patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Denisyuk Andrey 9
#2 Brulik Jan 6
#3 Lopour Filip 6
#4 Benner Gerd Ludwig 6
#5 Weiss Jon Karl 6
#6 Goupil Gregory 6
#7 Petras Stanislav 6
#8 Jiruse Jaroslav 5
#9 Lencová Bohumila 5
#10 Polster Jan 5

Latest patents

Publication Filing date Title
US2019295810A1 Method for automatically aligning a scanning transmission electron microscope for precession electron diffraction data mapping
CZ2018539A3 Apparatus with at least one positionable sample holder and method for changing the angle of inclination of the holder and method for preparing the lamella
EP3435403A1 Method of removal of matter using a focused ion beam
FR3079963A1 METHOD FOR ETCHING ONE OR MORE MIXED METAL AND DIELECTRIC LAYERS OF A SEMICONDUCTOR DEVICE
CZ307999B6 Device for creating and placing a lamella
EP3392900A1 A method for automatically aligning a scanning transmission electron microscope for precession electron diffraction data mapping
CZ2017566A3 A device with ion tube and scanning electron microscope
EP3607578A1 A method of etching one or more of mixed metal and dielectric layer of a semiconductor device
EP3379556A1 Scanning transmission electron microscope with a condenser objective system and a method of use thereof
EP3379236A1 Scanning transmission electron microscope
EP3379558A1 Scanning transmission electron microscope with an objective electromagnetic lens and a method of use thereof
EP3379557A1 Scanning transmission electron microscope and method for high throughput acquisition of electron scattering angle distribution images
CZ2016597A3 An objective lens for a device using at least one beam of charged particles
CZ2016300A3 A scanning electron microscope and the method of its operation
CZ2015651A3 A method of analysis of materials by a focused electron beam using the characteristic X-rays and the backscattered electrons and a device for its implementation
CZ2015517A3 A device for mass spectrometry