| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Finland | 4 | |
| #2 | United States | 4 | |
| #3 | EPO (European Patent Office) | 2 | |
| #4 | WIPO (World Intellectual Property Organization) | 2 | |
| #5 | Australia | 1 | |
| #6 | Poland | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Computer technology |
| # | Technology | |
|---|---|---|
| #1 | Measuring light | |
| #2 | Analysing materials | |
| #3 | Measuring length, angles and areas | |
| #4 | Electric digital data processing | |
| #5 | Measuring electric variables |
| # | Name | Total Patents |
|---|---|---|
| #1 | Kauppinen Jyrki | 9 |
| #2 | Saarinen Pekka | 6 |
| #3 | Raesaenen Jaakko | 4 |
| #4 | Jaakkola Petri | 3 |
| #5 | Turunen Osmo | 3 |
| #6 | Salomaa Ilkka | 3 |
| Publication | Filing date | Title |
|---|---|---|
| FI20030214A0 | Infrared modulator for spectrometer | |
| FI945818A0 | Multicomponent analysis of FT-IR spectra | |
| FI932815A0 | Focusing interferometer | |
| FI932816A0 | Scanning interferometer | |
| US5400265A | Procedure for enhancing resolution of spectral information |