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OTSUKA DENSHI CO LTD

Overview
  • Total Patents
    124
  • GoodIP Patent Rank
    54,975
  • Filing trend
    0.0%
About

OTSUKA DENSHI CO LTD has a total of 124 patent applications. It increased the IP activity by 0.0%. Its first patent ever was published in 1998. It filed its patents most often in Japan, China and Taiwan. Its main competitors in its focus markets measurement, optics and audio-visual technology are OTSUKA DENSHI KK, OTSUKA ELECTRONICS CO LTD and TEMET INSTR OY.

Patent filings in countries

World map showing OTSUKA DENSHI CO LTDs patent filings in countries
# Country Total Patents
#1 Japan 122
#2 China 1
#3 Taiwan 1

Patent filings per year

Chart showing OTSUKA DENSHI CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Mizuguchi Tsutomu 15
#2 Enami Tsuguyuki 13
#3 Shiraiwa Hisashi 11
#4 Okubo Kazuaki 10
#5 Sekiwa Mitsunao 10
#6 Taguchi Toichi 9
#7 Tsutsui Kazunori 8
#8 Kitagishi Keiko 8
#9 Osawa Sachihiro 8
#10 Sano Hiroyuki 8

Latest patents

Publication Filing date Title
JP2020038226A Optical measurement device
JP2019158892A Calibration method of optical characteristic measurement system
JP2020176842A Optical unit, optical measurement device, and optical measurement method
JP2020153713A Light-emitting body measurement device and light-emitting body measurement method
JP2020122680A Optical measuring system and optical measurement method
JP2020051854A Measurement system and measurement method
JP2019200184A Thickness measurement device and thickness measurement method
JP2019200185A Optical measurement unit and optical measurement method
JP2019191420A Confocal optical system measurement device, and confocal optical system measurement device manufacturing method
JP2018205295A Optical measuring device and optical measuring method
JP2019105561A Measurement instrument and sample holder used for the same
JP2019086368A Optical characteristic measuring method and optical characteristic measuring system
JP2019015576A Optical measuring device and optical measurement method
JP2018205132A Optical measuring device and optical measuring method
JP2018128326A Optical spectrum measuring device and method of measuring optical spectrum
JP2018100853A Optical characteristic measuring apparatus and optical characteristic measuring method
JP2018048980A Spectrometry device
JP2018040764A Optical measurement method and optical measurement instrument
JP2017133869A Thickness measuring device and thickness measuring method
JP2017116459A Optical characteristics measuring apparatus, and optical system