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ON LINE TECHN INC

Overview
  • Total Patents
    40
About

ON LINE TECHN INC has a total of 40 patent applications. Its first patent ever was published in 1990. It filed its patents most often in WIPO (World Intellectual Property Organization), United States and Australia. Its main competitors in its focus markets measurement, semiconductors and electrical machinery and energy are OTSUKA DENSHI KK, 10103560 CANADA LTD and TEMET INSTR OY.

Patent filings per year

Chart showing ON LINE TECHN INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Solomon Peter R 22
#2 Rosenthal Peter A 17
#3 Carangelo Robert M 17
#4 Hamblen David G 7
#5 Morrison Philip W 5
#6 Spartz Martin L 5
#7 Bonanno Anthony S 5
#8 Wright David D 5
#9 Xu Jiazhan 4
#10 Charpenay Sylvie 4

Latest patents

Publication Filing date Title
AU7702900A Method and apparatus for performing optical measurements of layers and surface properties
WO9964814A1 Method and apparatus for determining processing chamber cleaning or wafer etching endpoint
US6192287B1 Method and apparatus for fault detection and control
US6161054A Cell control method and apparatus
US5900633A Spectrometric method for analysis of film thickness and composition on a patterned sample
US5675412A System including unified beamsplitter and parallel reflecting element, and retroreflecting component
US5604581A Film thickness and free carrier concentration analysis method and apparatus
US5432336A Detector signal correction method and system
US5440143A Folded-path optical analysis gas cell
US5486917A Flexture plate motion-transfer mechanism, beam-splitter assembly, and interferometer incorporating the same
US5473429A Method and apparatus for controlling the reciprocating translation of an interferometer reflector or other body
WO9502813A1 Method and apparatus for monitoring layer processing
WO9402832A1 Method and apparatus for monitoring layer processing
US5285167A Method and apparatus for signal compression
US5239488A Apparatus and method for determining high temperature surface emissivity through reflectance and radiance measurements