TELAIRE SYSTEMS INC has a total of 17 patent applications. Its first patent ever was published in 1992. It filed its patents most often in Australia, WIPO (World Intellectual Property Organization) and United States. Its main competitors in its focus markets measurement and machines are IR MICROSYSTEMS SA, VUV ANALYTICS INC and POINTSOURCE TECHNOLOGIES LLC.
# | Country | Total Patents | |
---|---|---|---|
#1 | Australia | 5 | |
#2 | WIPO (World Intellectual Property Organization) | 5 | |
#3 | United States | 3 | |
#4 | Canada | 1 | |
#5 | China | 1 | |
#6 | EPO (European Patent Office) | 1 | |
#7 | Mexico | 1 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Machines |
# | Technology | |
---|---|---|
#1 | Analysing materials | |
#2 | Unspecified technologies | |
#3 | Measuring light |
# | Name | Total Patents |
---|---|---|
#1 | Wong Jacob Y | 10 |
#2 | Wong Jacob Yauman | 6 |
#3 | Wong J Y | 1 |
Publication | Filing date | Title |
---|---|---|
US5444249A | NDIR gas sensor | |
WO9604607A1 | Self-calibration of an ndir gas sensor | |
AU7322594A | Ndir gas analysis using spectral ratioing technique | |
WO9600374A1 | Functional testing method for toxic gas sensors | |
US5408101A | Laser assisted quasi-blackbody radiation source |