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OPTOSENS OPTISCHE SPEKTROSKOPI

Overview
  • Total Patents
    16
About

OPTOSENS OPTISCHE SPEKTROSKOPI has a total of 16 patent applications. Its first patent ever was published in 1996. It filed its patents most often in Germany, Australia and United States. Its main competitors in its focus markets measurement are POINTSOURCE TECHNOLOGIES LLC, FORCE A and VUV ANALYTICS INC.

Patent filings in countries

World map showing OPTOSENS OPTISCHE SPEKTROSKOPIs patent filings in countries

Patent filings per year

Chart showing OPTOSENS OPTISCHE SPEKTROSKOPIs patent filings per year from 1900 to 2020

Focus industries

# Industry
#1 Measurement

Focus technologies

Top inventors

# Name Total Patents
#1 Mittenzwey Klaus-Henrik 10
#2 Sinn Gert 10
#3 Sinn Gert Dr 4
#4 Mittenzwey Klaus-Henrik Dr 3
#5 Mittenwzey Klaus-Henrik Dr 1

Latest patents

Publication Filing date Title
DE10303805A1 Sample transmission measurements, in analysis or environmental monitoring or quality/process control, comprises directing light at sample through lens, and measuring scattered light at least at two points on sample surface
DE10259182A1 Synchronous measurement of refraction and absorption of samples, involves detecting transmitted intensities using optoelectronic receiver
DE10118671A1 Measuring refraction of multiple component samples comprises determining refraction, absorption and concentration balance of sample to form equilibrium system, and solving equilibrium system
DE10032739A1 Simultaneous detection of diffuse and specular reflections in transparent fluids for e.g. environmental monitoring, quality control, process monitoring and spectroscopy uses radiation evaluation at four positions on plane
DE10002238A1 Detecting specular reflection of opaque samples, involves defining the number and type of optical state variables to be recorded depending on the composition of the sample
DE19934934C1 Diffuse and specular reflection measuring method has diffuse reflection component, spectral reflection component and transmission components received at detection planes of at least 2 optoelectronic detectors
DE19920184A1 Methods for the simultaneous detection of diffuse and specular reflection of samples, in particular opaque samples, and reflectance measuring probe
DE19920193A1 Apparatus for determining the absorption, scattering, fluorescence, and refraction of liquids and solids has an optical module, reflection module and right angle modules connected via an assembly block
DE19819873A1 Combined absorption and reflection spectroscope for synchronous measurement of absorption, fluorescence, scattering and refraction
AU5547798A Method and device for combined absorption and reflectance spectroscopy
DE19751403A1 Process and assembly for determining absorption, fluorescence, scatter and refraction of liquids, gases and solids
DE19733253A1 Absorption and reflection spectroscopy method
DE19730826A1 Absorption and reflection spectroscopy method
DE19647222C1 Absorption and reflection spectroscopy method