|
DE102020126037A1
|
|
APPLICATION TECHNOLOGY FOR ENCLOSED COMPONENTS USING A UV-CURABLE CONDUCTIVE ADHESIVE
|
|
US2021018532A1
|
|
Encapsulated component attachment technique using a uv-cure conductive adhesive
|
|
DE102020125744A1
|
|
BUS CAR DETECTION
|
|
US2021096971A1
|
|
Bus autodetect
|
|
WO2021055631A1
|
|
Simulation correction using measurements and deep learning
|
|
US2021081630A1
|
|
Combined higher order statistics and artificial intelligence signal analysis
|
|
US2021081257A1
|
|
Multi-instrument behavior synchronization using jobs and milestones
|
|
DE102020122440A1
|
|
Signal path calibration of a hardware setting in a test and measurement instrument
|
|
US2021063488A1
|
|
Signal path calibration of a hardware setting in a test and measurement instrument
|
|
DE102020118069A1
|
|
DQ0 AND INVERSE DQ0 TRANSFORMATION FOR THREE-PHASE CONVERTER, MOTOR AND CONTROLLER DESIGN
|
|
US2021013818A1
|
|
Dq0 and inverse dq0 transformation for three-phase inverter, motor and drive design
|
|
DE102020115358A1
|
|
MILLIMETER WAVE MATERIAL TESTING SYSTEM
|
|
CN112051425A
|
|
Mode acquisition in an equivalent time sampling system
|
|
DE102020114908A1
|
|
LOW FREQUENCY S PARAMETER MEASUREMENT
|
|
US2020386801A1
|
|
Millimeter wave material test system
|
|
US2020386809A1
|
|
Low frequency s-parameter measurement
|
|
US2020386791A1
|
|
Pattern acquisitions in equivalent time sampling systems
|
|
DE102020112714A1
|
|
TEST AND MEASURING SYSTEM FOR PARALLEL WAVE SHAPE ANALYSIS
|
|
US2020363471A1
|
|
Test and measurement system for parallel waveform analysis
|
|
DE102020107556A1
|
|
SURFACE-MOUNTED DEVICE FOR COUPLING A TESTING AND MEASURING INSTRUMENT TO A COMPONENT TO BE TESTED
|
