SYSTEMS ON SILICON MFG COMPANY has a total of 12 patent applications. Its first patent ever was published in 2003. It filed its patents most often in United States, Singapore and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets semiconductors, measurement and electrical machinery and energy are MICROELECTRONICS & COMPUTER, ALPINE MICROSYSTEMS INC and DINGFENG WANG.
# | Country | Total Patents | |
---|---|---|---|
#1 | United States | 5 | |
#2 | Singapore | 4 | |
#3 | WIPO (World Intellectual Property Organization) | 2 | |
#4 | Australia | 1 |
# | Industry | |
---|---|---|
#1 | Semiconductors | |
#2 | Measurement | |
#3 | Electrical machinery and energy | |
#4 | Audio-visual technology | |
#5 | IT methods for management | |
#6 | Control | |
#7 | Surface technology and coating | |
#8 | Environmental technology |
# | Name | Total Patents |
---|---|---|
#1 | Ng Khim Hong | 4 |
#2 | Koh Kar Hwee | 3 |
#3 | Ng Yeow Keong | 3 |
#4 | Ho Yew Kuan | 1 |
#5 | Pong Chin Ling | 1 |
#6 | Lee Chin Fong | 1 |
#7 | Tan Kok T | 1 |
#8 | Su Hsiang Ju | 1 |
#9 | Lee Wan Mei Y | 1 |
#10 | Bala Singh Raja Salavam | 1 |
Publication | Filing date | Title |
---|---|---|
SG132530A1 | Method and assembly for wafer positioning inspection | |
US2006259173A1 | Capacity management in a wafer fabrication plant | |
US2006243919A1 | TEM sample preparation from a circuit layer structure | |
US2006125504A1 | Printed circuit board for burn-in testing | |
SG121907A1 | Detection method and system for non-coating of photoresist | |
SG120198A1 | Multi layer defects calculation method and system | |
WO2004083483A1 | A method of repairing a pedestal surface | |
SG121754A1 | Method of forming shallow trench isolation structures | |
US2005116350A1 | Titanium underlayer for lines in semiconductor devices |