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SIGRAY INC

Overview
  • Total Patents
    75
  • GoodIP Patent Rank
    19,396
  • Filing trend
    ⇧ 33.0%
About

SIGRAY INC has a total of 75 patent applications. It increased the IP activity by 33.0%. Its first patent ever was published in 2014. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and China. Its main competitors in its focus markets measurement, electrical machinery and energy and engines, pumps and turbines are BEDE SCIENT INSTR LTD, DANOS MICHAEL and MICROMASS LTD.

Patent filings per year

Chart showing SIGRAY INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Yun Wenbing 74
#2 Kirz Janos 71
#3 Lewis Sylvia Jia Yun 58
#4 Lyon Alan Francis 24
#5 Seshadri Srivatsan 17
#6 Vine David 9
#7 Stripe Benjamin Donald 9
#8 Lewis Sylvia 7
#9 Reynolds David Charles 4
#10 Stripe Benjamin 3

Latest patents

Publication Filing date Title
WO2021046059A1 System and method for computed laminography x-ray fluorescence imaging
US2021020398A1 X-ray source with rotating anode at atmospheric pressure
WO2020051221A2 System and method for depth-selectable x-ray analysis
US2020072770A1 System and method for x-ray fluorescence with filtering
US2020041428A1 Talbot-lau x-ray source and interferometric system
GB202102640D0 High brightness x-ray reflection source
US2019369271A1 Wavelength dispersive x-ray spectrometer
US2020365361A1 Coded x-ray target
US2019302042A1 X-ray emission spectrometer system
WO2019027761A1 X-ray transmission spectrometer system
WO2019074548A1 X-ray illumination system with multiple target microstructures
WO2018191753A1 Talbot x-ray microscope
CN110520716A TALBOT X-ray microscope
US2018261350A1 Talbot X-ray microscope
CN110621986A Method of performing x-ray spectral analysis and x-ray absorption spectrometer system
US2019011379A1 Method of performing X-ray spectroscopy and X-ray absorption spectrometer system
US2018202951A1 Material measurement techniques using multiple X-ray micro-beams
US2018144901A1 X-ray illumination system with multiple target microstructures
US2017336334A1 X-ray transmission spectrometer system
CN109564176A Method and apparatus for x-ray microexamination