| # | Country | Total Patents | |
|---|---|---|---|
| #1 | China | 8 | |
| #2 | Taiwan | 4 | |
| #3 | Republic of Korea | 2 | |
| #4 | Hong Kong | 1 | |
| #5 | United States | 1 |
| # | Industry | |
|---|---|---|
| #1 | Semiconductors | |
| #2 | Electrical machinery and energy | |
| #3 | Audio-visual technology | |
| #4 | Packaging and shipping | |
| #5 | Machines | |
| #6 | Optics | |
| #7 | Chemical engineering |
| # | Name | Total Patents |
|---|---|---|
| #1 | Nakamura Akio | 2 |
| #2 | Hosoi Masato | 2 |
| #3 | Kawaguchi Toshiyuki | 2 |
| #4 | Komatsu Hiroto | 2 |
| #5 | Ogawa Osamu | 2 |
| #6 | Aizawa Junichi | 1 |
| #7 | Yoshida Kazuyoshi | 1 |
| #8 | Hayashi Osami | 1 |
| #9 | Kin Anto | 1 |
| #10 | Ikeno Junichi | 1 |
| Publication | Filing date | Title |
|---|---|---|
| TW353211B | Probe and method for inspection of electronic circuit board |