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US2009102495A1
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Vertical guided probe array providing sideways scrub motion
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US2008252325A1
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Vertical probe array arranged to provide space transformation
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US2008001613A1
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Probe skates for electrical testing of convex pad topologies
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US2008265873A1
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Low profile probe having improved mechanical scrub and reduced contact inductance
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US2008001612A1
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Probes with self-cleaning blunt skates for contacting conductive pads
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US2007152686A1
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Knee probe having increased scrub motion
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US2007216432A1
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Space transformers employing wire bonds for interconnections with fine pitch contacts
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US2007132466A1
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Probe cards employing probes having retaining portions for potting in a retention arrangement
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TW200602644A
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Cantilever probe with dual plane fixutre and probe apparatus therewith
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TW200600790A
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Double acting spring probe
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US2005258844A1
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Freely deflecting knee probe with controlled scrub motion
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