Learn more

SEC CO LTD

Overview
  • Total Patents
    99
  • GoodIP Patent Rank
    78,472
  • Filing trend
    ⇧ 33.0%
About

SEC CO LTD has a total of 99 patent applications. It increased the IP activity by 33.0%. Its first patent ever was published in 2000. It filed its patents most often in Republic of Korea, WIPO (World Intellectual Property Organization) and China. Its main competitors in its focus markets measurement, electrical machinery and energy and semiconductors are KHALID WAQAS, AUROS TECHNOLOGY CO LTD and LINK ANALYTICAL LTD.

Patent filings per year

Chart showing SEC CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kim Jong Hyun 20
#2 Yoon Joong Suk 15
#3 Kim Jong Hyeon 14
#4 Youn Joong Suk 14
#5 Kim Young Man 14
#6 Ryu Ki Ung 11
#7 Tae Jin Woo 8
#8 Lee Sang Ryul 8
#9 Kim Jong-Hyun 7
#10 Sohn You Joo 7

Latest patents

Publication Filing date Title
KR20210009271A X-ray inspecting apparatus
KR20210006036A X-ray inspection apparatus having vibration reduction member of surpport plate for object to be inspected
KR20190044031A Heating apparatus for manufacturing component
KR20180100529A Filter for reducing low energy x-ray, x-ray tube comprising the filter and x-ray system comprising the filter
KR20190125656A X-ray inspection apparatus
KR102020633B1 Transformer, generator and apparatus for generating x-ray using the same
KR20190102368A Filter for reducing low energy bandwidth x-ray, x-ray tube comprising the filter, and x-ray apparatus comprising the filter
KR20180045815A Hot bar plate and heater for manufacturing component
WO2018212377A1 X-ray tube
KR20180062604A Apparatus for generating x-ray
KR20180051175A Filter for reducing low energy x-ray, x-ray tube comprising the filter and x-ray system comprising the filter
KR20180045283A Heating apparatus for manufacturing component
KR20180045297A Method for fabricating hot bar plate, hot bar plate and heater for manufacturing component
KR101837119B1 X-ray inspecting system for regulating automatic resolution according to x-ray magnification
KR20160149494A X-ray inspecting apparatus
KR101552318B1 X-ray generation apparatus, computerized tomography system having the same and method for control thereof
KR20160118047A Chip counting apparatus
KR101648063B1 X-ray generating apparatus and method for control thereof
KR20150064928A X-ray generating apparatus
KR20140140722A Scanning electron microscope and methed for specimen inspecting using the same