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PROTOCHIPS INC

Overview
  • Total Patents
    74
  • GoodIP Patent Rank
    31,276
  • Filing trend
    ⇧ 233.0%
About

PROTOCHIPS INC has a total of 74 patent applications. It increased the IP activity by 233.0%. Its first patent ever was published in 2005. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and EPO (European Patent Office). Its main competitors in its focus markets electrical machinery and energy, measurement and control are MELBIL CO LTD, ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH and EXTRANUCLEAR LAB INC.

Patent filings in countries

World map showing PROTOCHIPS INCs patent filings in countries

Patent filings per year

Chart showing PROTOCHIPS INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Nackashi David P 48
#2 Damiano Jr John 42
#3 Mick Stephen E 29
#4 Gardiner Daniel Stephen 27
#5 Walden Ii Franklin Stampley 27
#6 Carpenter William Bradford 21
#7 Damiano John Jr 13
#8 Damiano John 9
#9 David P Nackashi 6
#10 Schmelzer Thomas G 6

Latest patents

Publication Filing date Title
WO2021034569A2 Automated application of drift correction to sample studied under electron microscope
WO2019217873A1 Sample support with fiducial indicia
WO2019156964A1 Sample support structure for cryo-electron microscopy
EP3649529A1 Electron microscope sample holder fluid handling with independent pressure and flow control
US2018372672A1 Electrochemistry device with improved electrode arrangement
WO2018169927A1 Electrical devices with edge slits for mounting sample
US2017062177A1 MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples
US2016336144A1 Method for enabling modular part replacement within an electron microscope sample holder
NL2015258A Method for safe control of gas delivery to an electron microscope sample holder.
WO2015187814A1 Method for optimizing fluid flow across a sample within an electron microscope sample holder
US2015338322A1 Membrane supports with reinforcement features
US2015235805A1 Device for monitoring environmental states of a microscope sample with an electron microscope sample holder
US2015129778A1 Specimen holder used for mounting samples in electron microscopes
US2014268321A1 Device for imaging electron microscope environmental sample supports in a microfluidic or electrochemical chamber with an optical microscope
EP2920807A1 A method for forming an electrical connection to a sample support in an electron microscope holder
US2013277572A1 Sample holder providing interface to semiconductor device with high density connections
WO2013102064A1 Sample holder for electron microscopy for low-current, low-noise analysis
WO2012018827A2 Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices
EP2942801A1 Methods of using temperature control devices in electron microscopy
WO2009117412A1 Specimen holder used for mounting samples in electron microscopes