| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 4 | |
| #2 | China | 3 | |
| #3 | EPO (European Patent Office) | 3 | |
| #4 | WIPO (World Intellectual Property Organization) | 2 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Optics | |
| #3 | Computer technology | |
| #4 | Audio-visual technology | |
| #5 | Electrical machinery and energy |
| # | Technology | |
|---|---|---|
| #1 | Analysing materials | |
| #2 | Optical systems | |
| #3 | Scanning-probe techniques | |
| #4 | Measuring light | |
| #5 | Television | |
| #6 | Image data processing | |
| #7 | Electric discharge tubes | |
| #8 | Specific computer systems |
| # | Name | Total Patents |
|---|---|---|
| #1 | Prater Craig | 12 |
| #2 | Shetty Roshan | 10 |
| #3 | Kjoller Kevin | 7 |
| #4 | Decker Derek | 3 |
| #5 | Kansiz Mustafa | 1 |
| #6 | Yang Honghua | 1 |
| Publication | Filing date | Title |
|---|---|---|
| EP3803325A1 | Wide area optical photothermal infrared spectroscopy | |
| US2020309681A1 | Method and apparatus for reducing noise in spectroscopic data at a point on a sample | |
| US2019120753A1 | Method and apparatus for enhanced photo-thermal imaging and spectroscopy | |
| US2020025677A1 | Method and apparatus for enhanced photo-thermal imaging and spectroscopy | |
| CN110234982A | Method and apparatus for chemical imaging atomic force microscope infra-red sepectrometry |