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Reflectometer, spectrophotometer, ellipsometer and polarimeter systems with a super continuum laser source of a beam of electromagnetism, and improved detector system
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Beam focusing and reflecting optics with enhanced detector system
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Beam focusing and reflective optics
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Biased fast axis retarder system
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Method to analyze spectroscopic ellipsometry data of porous samples utilizing the anisotropic Bruggeman-effective medium theory
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Beam focusing and beam collecting optics with wavelength dependent filter element adjustment of beam area
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Reflectometer, spectrophometer, ellipsometer and polarimeter system with a super continuum laser-source of a beam of electromagnetism and improved detector system
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Information maintenance, intensity attenuation, and angle/plane of incidence control in electromagentic beams
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Reflectometer, spectrophotometer, ellipsometer or polarimeter system including sample imaging system that simultaneously meets scheimpflug condition and overcomes keystone error
