Learn more

LIPHARDT MARTIN M

Overview
  • Total Patents
    17
  • GoodIP Patent Rank
    218,174
About

LIPHARDT MARTIN M has a total of 17 patent applications. Its first patent ever was published in 2006. It filed its patents most often in United States. Its main competitors in its focus markets measurement, optics and audio-visual technology are DANFOSS IXA AS, SENTROL SYSTEMS LTD and THERMO FISHER SCIENT ECUBLENS SARL.

Patent filings in countries

World map showing LIPHARDT MARTIN Ms patent filings in countries
# Country Total Patents
#1 United States 17

Patent filings per year

Chart showing LIPHARDT MARTIN Ms patent filings per year from 1900 to 2020

Focus industries

Top inventors

# Name Total Patents
#1 Liphardt Martin M 17
#2 He Ping 7
#3 Johs Blaine D 5
#4 Pfeiffer Galen L 4
#5 Hale Jeffrey S 2
#6 Welch James D 2
#7 Synowicki Ronald A 1
#8 Meyer Duane E 1
#9 Herzinger Craig M 1
#10 Tiwald Thomas E 1

Latest patents

Publication Filing date Title
US10247611B1 Enhanced detector operation made possible by application of a functional plurality of gratings and combination dichroic beam splitter-prisms
US2015185136A1 System for viewing samples that are undergoing ellipsometric investigation in real time
US2012314218A1 View-finder in ellipsometer or the like systems
US8983787B1 Method of evaluating data quality
US8953030B1 System for viewing samples that are undergoing ellipsometric investigation in real time
US2012092653A1 System and method of aligning a sample
US8749782B1 DLP base small spot investigation system
US2011109906A1 Fast sample height, AOI and POI alignment in mapping ellipsometer or the like
US8416410B1 Conjugate ratio adjustable lens system
US8600703B1 Method of evaluating data quality
US8159672B1 Sample investigating system and method of use
US8189193B1 System and method of applying horizontally oriented arc-lamps in ellipsometer or the like systems
US8339603B1 Mapping ellipsometers and polarimeters comprising polarization state compensating beam directing means, and method of use
US8248606B1 Sample mapping in environmental chamber
US8339602B1 View-finder in ellipsometer or the like systems
US2009207408A1 System and method of aligning a sample
US7738105B1 System and method of applying horizontally oriented arc-lamps in ellipsometer or the like systems