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NANO PHOTON KK

Overview
  • Total Patents
    30
  • GoodIP Patent Rank
    209,818
  • Filing trend
    ⇩ 100.0%
About

NANO PHOTON KK has a total of 30 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 2003. It filed its patents most often in Japan. Its main competitors in its focus markets measurement and optics are ASTEM KK, JOBIN YVON SAS and HORIBA JOBIN YVON INC.

Patent filings in countries

World map showing NANO PHOTON KKs patent filings in countries
# Country Total Patents
#1 Japan 30

Patent filings per year

Chart showing NANO PHOTON KKs patent filings per year from 1900 to 2020

Focus industries

# Industry
#1 Measurement
#2 Optics

Focus technologies

Top inventors

# Name Total Patents
#1 Kobayashi Minoru 20
#2 Oide Takahiro 11
#3 Ota Taisuke 10
#4 Kawada Satoshi 9
#5 Fujita Katsumasa 6
#6 Kawano Shogo 6
#7 Nakamura Osamu 5
#8 Kubota Naoyoshi 2
#9 Tomizawa Hiromitsu 2
#10 Matsuzaka Shunichiro 2

Latest patents

Publication Filing date Title
JP2019035882A Optical microscope and spectral measurement method
JP2018128325A Spectroscopic microscope, and spectroscopic observation method
JP2018004616A Uneven distribution detection method of granular substance in observation object
JP2014219358A Display method of molecular vibration
JP2014215091A Raman spectrum database construction method
JP2013057689A Spectrometry, scattering type near field optical microscope, and manufacturing method for tip-enhanced raman probe
JP2014048529A Raman microscope
JP2012233707A Sealed vessel for observation sample
JP2012168492A Light-shielding member applied to microscope
JP2012189891A Optical microscope and spectral measurement method
JP2012093675A Polarized beam conversion element, polarized beam conversion method, electron gun, beam measurement device, and electron generation method
JP2012047668A Spectrometry device and spectrometry method
JP2010127726A Optical microscope and spectrum measurement method
JP2010054391A Optical microscope, and method of displaying color image
JP2010054368A Optical microscope and observation method
JP2009293994A Optical microscope and observation method
JP2007264664A Laser microscope
JP2008288099A Electron gun, electron generating method, and element whose polarization state can be controlled
JP2007179002A Optical microscope and method of measuring spectrum
JP2008039882A Optical microscope and observation method