| # | Country | Total Patents | |
|---|---|---|---|
| #1 | EPO (European Patent Office) | 3 | |
| #2 | France | 3 | |
| #3 | WIPO (World Intellectual Property Organization) | 3 | |
| #4 | Canada | 1 | |
| #5 | China | 1 | |
| #6 | Republic of Korea | 1 | |
| #7 | United States | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Optics |
| # | Technology | |
|---|---|---|
| #1 | Measuring light | |
| #2 | Optical systems | |
| #3 | Testing of structures | |
| #4 | Analysing materials |
| # | Name | Total Patents |
|---|---|---|
| #1 | Wattellier Benoit | 9 |
| #2 | Saintoyant Anais | 4 |
| #3 | Saintoyant Anaïs | 3 |
| #4 | Wattellier Benoît | 3 |
| #5 | Maire Guillaume | 3 |
| #6 | Giovanini Hugues | 3 |
| #7 | Monneret Serge | 3 |
| #8 | Bon Pierre | 3 |
| #9 | Boucher William | 2 |
| #10 | Boucher William David | 1 |
| Publication | Filing date | Title |
|---|---|---|
| FR3057064A1 | METHOD AND DEVICE FOR ANALYSIS OF AN ELECTROMAGNETIC WAVE IN HIGH DEFINITION | |
| FR2951269A1 | Method and system for structural analysis of a wavelenfront measurement object | |
| FR2933188A1 | METHOD AND DEVICE FOR MEASURING FOCAL DISTANCES OF ANY DIOPTRICAL SYSTEM. |