Imaging optical inspection device with a pinhole camera
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Supply voltage and temperature independent circuit arrangement for measuring electric signals of sensors
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Method for producing micromechanical elements can be integrated into cmos technology, carrying monolith si and monolith sio produced by porous si micromanufacturing process
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Method of multichannel measurements in integrated optical waveguide structures
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Corrosive chemical agent resistent diamond-diamondlike carbon protective layer system and producing it
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Ionoptical system and method
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Thermally and electrically isolated membrane micro-structures stabilised by a support can be integrated
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Measuring arrangement and method for the fast quantitative topographical examination of semi-conductor slices and other mirror-like surfaces
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Optical image forming inspection apparatus with divergent illumination
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Image forming optical testing apparatus with divergent illumination
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In vitro impedance measuring method and apparatus for examination effects of biological materials, potential pharmaceuticals
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Multiplet lens of variable focal length
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Method for the nondestructive tracing of the exposition and development phases of a photolithographic process
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Method of manufacturing an integrated optical element and wavelength selective element on wavelength divison multiplexer systems
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Method for the determination of physical parameters of thin films, preferably photoresist films, via the measurement of their waveguiding parameters
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High sensitivity semiconductor-base pressure meter device
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Process for measuring the dna content of cells
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Method and device for measuring small magnetic fields and small changes in magnetic fields, as well as magnetometer probe
