Learn more

MIRTEC CO LTD

Overview
  • Total Patents
    86
  • GoodIP Patent Rank
    53,491
  • Filing trend
    ⇩ 20.0%
About

MIRTEC CO LTD has a total of 86 patent applications. It decreased the IP activity by 20.0%. Its first patent ever was published in 2003. It filed its patents most often in Republic of Korea, WIPO (World Intellectual Property Organization) and Taiwan. Its main competitors in its focus markets measurement, audio-visual technology and computer technology are MER SKILFUL FEAT CO LTD, MACHVISION INC and MYTHOS.

Patent filings per year

Chart showing MIRTEC CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Pak Chan Wha 38
#2 Kim Sung Hyun 17
#3 Lee Hyun Yul 11
#4 Jang Kwon Kyu 9
#5 Kim Ki Young 8
#6 Oh Sang Min 7
#7 Jeong Joon-Young 7
#8 Park Chan Wha 7
#9 Koo Ja Myoung 7
#10 Jang Seong Guk 5

Latest patents

Publication Filing date Title
KR102023087B1 Method for camera calibration
KR20190136804A Apparatus for measuring three dimension shape using optical fiber
KR20190136794A Appearance inspecting apparatus of camera module using multi camera
KR102030685B1 Method for determining focus height using prediction of warpage for measuring printed circuit board
KR101961820B1 Maintenance forecast system for vision inspection apparatus
KR20180123870A System for measuring three dimension shape and Method thereof
KR101876391B1 Apparatus for inspecting three dimension Using multi-channel image of single color light Moire
KR20180075141A 3D shape measuring Apparatus using multi grating
KR20180075138A Coaxial lighting device for inspection
KR20170131084A 3-Dimensional Shape Measuring Apparatus Using Multi Wavelength Lights Scanning Interferometry
KR20170131085A Intergrated Inspection Apparatus Using Multi Optical System
KR20170027892A Method for generating reference pattern of 3D shape measuring device
KR20170027893A Method for 3D shape measuring using of Triple Frequency Pattern
KR101705762B1 Method for Correcting tilt of 3D shape measuring device
KR20160141015A Method for bonding flexible printed circuit board
KR20160141014A Apparatus for bonding flexible printed circuit board
KR101583659B1 Apparatus for measuring three dimension shape
KR101628158B1 Apparatus for measuring three dimension shape
KR101557783B1 Compact vision inspection apparatus
KR101465996B1 Method for measurement of high speed 3d shape using selective long period