METRIS N V has a total of 11 patent applications. Its first patent ever was published in 2002. It filed its patents most often in EPO (European Patent Office), United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, control and computer technology are SA08700334, 3D SCANNERS LTD and HEXAGON METROLOGY GMBH.
# | Country | Total Patents | |
---|---|---|---|
#1 | EPO (European Patent Office) | 4 | |
#2 | United States | 4 | |
#3 | WIPO (World Intellectual Property Organization) | 3 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Control | |
#3 | Computer technology | |
#4 | Packaging and shipping |
# | Technology | |
---|---|---|
#1 | Measuring length, angles and areas | |
#2 | Control or regulating systems | |
#3 | Manipulators | |
#4 | Radio navigation | |
#5 | Healthcare informatics |
# | Name | Total Patents |
---|---|---|
#1 | De Jonge Lieven | 9 |
#2 | Van Coppenolle Bart | 9 |
#3 | Vanderstraeten Denis | 3 |
#4 | Crampton Stephen James | 2 |
#5 | Champ Peter | 2 |
#6 | Thys Frank | 2 |
#7 | Vallons Kris | 2 |
Publication | Filing date | Title |
---|---|---|
US2007043526A1 | Method for the automatic simultaneous synchronization, calibration and qualification of a non-contact probe | |
WO2006114216A1 | Method and device for scanning an object using robot manipulated non-contact scannering means and separate position and orientation detection means | |
EP1672583A1 | Laser tracking method and device | |
EP1682956A1 | A method, device and computer program for evaluating an object using a virtual representation of said object | |
US7009717B2 | Optical probe for scanning the features of an object and methods therefor | |
US6944564B2 | Method for the automatic calibration-only, or calibration and qualification simultaneously of a non-contact probe | |
EP1391688A1 | Optical probe with laser scanner for generating crossed lines | |
EP1361413A1 | Method for self-calibration of a non-contact probe |