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METRIS N V

Overview
  • Total Patents
    11
About

METRIS N V has a total of 11 patent applications. Its first patent ever was published in 2002. It filed its patents most often in EPO (European Patent Office), United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, control and computer technology are SA08700334, 3D SCANNERS LTD and HEXAGON METROLOGY GMBH.

Patent filings in countries

World map showing METRIS N Vs patent filings in countries

Patent filings per year

Chart showing METRIS N Vs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 De Jonge Lieven 9
#2 Van Coppenolle Bart 9
#3 Vanderstraeten Denis 3
#4 Crampton Stephen James 2
#5 Champ Peter 2
#6 Thys Frank 2
#7 Vallons Kris 2

Latest patents

Publication Filing date Title
US2007043526A1 Method for the automatic simultaneous synchronization, calibration and qualification of a non-contact probe
WO2006114216A1 Method and device for scanning an object using robot manipulated non-contact scannering means and separate position and orientation detection means
EP1672583A1 Laser tracking method and device
EP1682956A1 A method, device and computer program for evaluating an object using a virtual representation of said object
US7009717B2 Optical probe for scanning the features of an object and methods therefor
US6944564B2 Method for the automatic calibration-only, or calibration and qualification simultaneously of a non-contact probe
EP1391688A1 Optical probe with laser scanner for generating crossed lines
EP1361413A1 Method for self-calibration of a non-contact probe