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HEXAGON METROLOGY AB

Overview
  • Total Patents
    144
  • GoodIP Patent Rank
    207,152
About

HEXAGON METROLOGY AB has a total of 144 patent applications. Its first patent ever was published in 1997. It filed its patents most often in United States, China and EPO (European Patent Office). Its main competitors in its focus markets measurement, control and packaging and shipping are METRIS N V, DEA SPA and 3D SCANNERS LTD.

Patent filings per year

Chart showing HEXAGON METROLOGY ABs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Pettersson Bo 66
#2 Jordil Pascal 21
#3 Knut Siercks 19
#4 Hong Dongmei 15
#5 Tait Hogar 15
#6 Champ Peter 13
#7 Bo Pettersson 13
#8 Ferrari Paul 12
#9 Siercks Knut 12
#10 Desforges Laurent 11

Latest patents

Publication Filing date Title
US2013282162A1 Apparatus and method for dimensional metrology
US2011112786A1 Cmm with improved sensors
CN101939614A Measurement arrangement with a measurement head in order to carry out inspection measurement
EP2112461A1 Self-powered measuring probe
EP2139697A1 Computerized apparatus and method for applying graphics to surfaces
CN101663559A Method and device for exact measurement of objects
EP2042829A1 Modular calibration
EP2094437A1 Method and device for the compensation of geometrical errors in machining machinery
EP2097214A1 Method and device for the compensation of geometrical errors in machining machinery
US2009090013A1 Validating the error map of CMM using calibrated probe
US2009083985A1 Coordinate measurement machine
US2009013547A1 Joint for coordinate measurement device
EP1983297A1 Scanning probe with constant scanning speed
EP1978328A1 Oscillating scanning probe with constant contact force
EP1975546A1 Method of using multi-axis positioning and measuring system
WO2007091966A1 Position-determining arrangement and method for determining position
WO2007091967A1 Method for controlling garden or domestic machines, and garden or domestic machine.
EP1930687A1 Store for measurement machine and corresponding tool
EP1949028A1 Adjustment device for a measuring head
CN101287964A Method for signal processing of capacitive measurement scales