Measuring probe, especially for a device for the measurement of the thickness of thin layers
GB0621895D0
Calibration apparatus
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Measurement stand for holding a measuring instrument
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Calibration standard to calibrate devices for non-destructively measuring thickness of thin layers has standard with bearing surface plane-parallel with its measuring surface and permanently provided on carrier layer by plating via rubbing
GB0612007D0
Calibration standard
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Device for measuring the thickness of thin layers with a measuring probe
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Apparatus for manufacturing a measurement sample for energy dispersive x-ray florescence analysis of metals whereby metal is pressed into a sample holder
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Calibrating device for adapting a measuring device for measuring the thickness of thin layers on an object to be measured
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Method for optimizing measuring times of a measuring device
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Method for outputting measured values and display device
GB0328815D0
Apparatus for measurement of the thickness of thin layers
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Measurement cell for coulometric measurement of thickness of metal coating on base material has reference electrode that is at least partly annular between outer sleeve and application element or at least partly on or in application element
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Apparatus and method for estimating a distance to a preceding vehicle or obstacle
GB0325704D0
Apparatus for non-destructive measurement of the thickness of thin layers
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Measurement probe for measurement of the thickness of thin layers
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Measuring probe, in particular for a device for measuring the thickness of thin layers
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Device for nondestructive measurement of the thickness of thin layers
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Method and device for measuring the thickness of thin layers and circuit for driving the device
