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LEE UK KI

Overview
  • Total Patents
    39
About

LEE UK KI has a total of 39 patent applications. Its first patent ever was published in 1994. It filed its patents most often in Republic of Korea. Its main competitors in its focus markets measurement, optics and packaging and shipping are OKINS ELECTRONICS CO LTD, TSE CO LTD and YULIM HITECH INC.

Patent filings in countries

World map showing LEE UK KIs patent filings in countries
# Country Total Patents
#1 Republic of Korea 39

Patent filings per year

Chart showing LEE UK KIs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Lee Uk Ki 27
#2 Koo Cheol Hwan 5
#3 Ju Won Yong 3
#4 Yang Hee Sung 2
#5 Kim Tae Su 2
#6 Lee Jin Han 2
#7 Nam Myeong Hyeon 2
#8 Cho Yong Hwi 2
#9 Park Seong Hun 2
#10 Lee Jung Hwa 2

Latest patents

Publication Filing date Title
KR20050011673A Manufacturing method of probe having center hole
KR20050059977A Apparatus for patterning transparency conduction film and method thereby
KR20050023828A Board cutting type probe and method thereby
KR100446551B1 Volcano type probe, its manufacturing method and probe card having it
KR20040100507A Bone vibrating headphone structure having manifold joint head support
KR100419758B1 Paved road of road surface sign structure and method thereby
KR20040089959A Ball washing apparatus
KR100441809B1 Electrical contactor and method thereby
KR100444191B1 Probe positioning and bonding system and method thereof
KR100438481B1 Gripper installed in panel transferring device of Liquid Crystal Display Panel inspection equipment
KR100443999B1 Interconnector for Printed Circuit Board, method thereby and interconnector assembly having it
KR20040071789A Probe for manufacturing probe for testing flat pannel display, probe thereby, probe assembly having its
KR20040067526A Method for manufacturing tip of electric contactor for testing electro device
KR20040055849A Method for manufacturing probe for testing flat pannel display, probe thereby, probe assembly having it
KR20040044808A Probe sheet for testing flat pannel display, method thereby, probe assembly having it
KR20040040079A Electric contact element for testing electro device
KR20040037630A Vertical type electrical contactor and method for manufacturing its
KR100373762B1 Method for manufacturing cavity-type micro-probe using mems technology and micro-probe according to the same
KR20040007186A Pad of electro device, array structure and methof for manufacturing its
KR20040009227A Method for manufacturing vertical type probe card