| # | Country | Total Patents | |
|---|---|---|---|
| #1 | China | 4 | |
| #2 | Japan | 4 | |
| #3 | Taiwan | 4 | |
| #4 | WIPO (World Intellectual Property Organization) | 3 | |
| #5 | Republic of Korea | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Audio-visual technology | |
| #3 | Semiconductors | |
| #4 | Surface technology and coating | |
| #5 | Optics |
| # | Technology | |
|---|---|---|
| #1 | Analysing materials | |
| #2 | Layered products | |
| #3 | Semiconductor devices | |
| #4 | Casings and printed circuits | |
| #5 | Nonlinear optics | |
| #6 | Measuring length, angles and areas |
| # | Name | Total Patents |
|---|---|---|
| #1 | Guo Weihong | 12 |
| #2 | Tsuda Toyohiko | 8 |
| #3 | Tsuda Hitohiko | 5 |
| #4 | Zhang Chunsheng | 5 |
| #5 | Cho Haruo | 4 |
| #6 | Toyohiko Tsuda | 3 |
| #7 | Nishikawa Shinichi | 3 |
| #8 | Cheng Fei | 3 |
| #9 | Goto Satoshi | 3 |
| #10 | Guo Wei-Hong | 2 |
| Publication | Filing date | Title |
|---|---|---|
| JP2015143628A | Electronic component inspection device | |
| JP2011021999A | Substrate inspecting apparatus | |
| JP2010114194A | Anisotropic conductive film sticking apparatus | |
| JP2009210414A | Electronic component inspection method and device used for it |