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YOUNG TEK ELECTRONICS CORP

Overview
  • Total Patents
    28
  • GoodIP Patent Rank
    224,110
About

YOUNG TEK ELECTRONICS CORP has a total of 28 patent applications. Its first patent ever was published in 2005. It filed its patents most often in China and Japan. Its main competitors in its focus markets semiconductors, measurement and audio-visual technology are MI EQUIPMENT M SDN BHD, NINGBO SHINING OPTOELECTRONICS CO LTD and Jinan jingheng electronics co ltd.

Patent filings in countries

World map showing YOUNG TEK ELECTRONICS CORPs patent filings in countries
# Country Total Patents
#1 China 25
#2 Japan 3

Patent filings per year

Chart showing YOUNG TEK ELECTRONICS CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Binglong Wang 14
#2 Guibiao Chen 10
#3 Wang Binglong 7
#4 Chen Xincheng 6
#5 Chen Guibiao 6
#6 Xincheng Chen 5
#7 Minghao Zhou 3
#8 Chen Kuei-Pao 3
#9 Zhiming Wang 3
#10 O Heiryu 3

Latest patents

Publication Filing date Title
CN104793064A Substrate detection system
CN104124182A Turret type detection machine and using method thereof
CN103579069A Crystalline grain picking and placing method, bearing structure for picking and placing of crystalline grains and crystalline grain picking and placing device
CN102794271A Light-emitting diode packaged chip sorting system
CN102773219A Device for detecting and sorting light-emitting components
JP2012228638A Mounted chip test/selection device
CN102749333A Multi-track detection system for detecting appearances of multiple electronic components
CN102683166A Packaged-chip detecting and classifying device
CN102243186A Method for detecting chip appearance
CN102213680A Device and method for detecting luminous diode grain appearance
CN102189060A Multi-orbit glue dispensing system used for improving glue dispensing efficiency and application method thereof
CN101852850A Global position determination system device with display function and using method thereof
CN101825583A Detection system for detecting appearance of a plurality of electronic elements and use method thereof
CN101788503A Bare chip defect detecting system for detecting defects at back face of bare chip and using method thereof
CN101576510A Detection system and detection method of electronic element
CN101551522A Optical type object distance simulation device used for shortening total optical path
CN101520548A Homogeneous light generating system used for testing image sensing device and use method thereof
CN101431039A Wafer detection system
CN101119619A Electronic product housing having waterproof and non-screw locking function
JP2008026015A Device for measuring static parameter of integrated circuit