INFRA SYSTEMS INC has a total of 29 patent applications. Its first patent ever was published in 1970. It filed its patents most often in Germany, United Kingdom and France. Its main competitors in its focus markets measurement are TOUYOKO ERUMESU KK, YAMANASHI GIJUTSU KOBO KK and ACTIVE IMPULSE SYSTEMS INC.
# | Country | Total Patents | |
---|---|---|---|
#1 | Germany | 6 | |
#2 | United Kingdom | 6 | |
#3 | France | 5 | |
#4 | Italy | 4 | |
#5 | United States | 4 | |
#6 | Canada | 3 | |
#7 | Japan | 1 |
# | Industry | |
---|---|---|
#1 | Measurement |
# | Technology | |
---|---|---|
#1 | Analysing materials | |
#2 | Measuring length, angles and areas | |
#3 | Measuring electric variables |
# | Name | Total Patents |
---|---|---|
#1 | Williams Paul | 6 |
#2 | Campanella Angelo Joseph | 3 |
#3 | Soltesz Carl Richard | 2 |
#4 | Brunton Donald C | 2 |
#5 | Campanella Angelo J | 2 |
#6 | Soltesz C | 1 |
#7 | Horne William Earl Van | 1 |
#8 | Brunton Donald G | 1 |
#9 | Furanku Ii Hafuman | 1 |
#10 | Van Horne William E | 1 |
Publication | Filing date | Title |
---|---|---|
GB1483215A | Infrared measuring circuits | |
US3870884A | Apparatus for negating effect of scattered signals upon accuracy of dual-beam infrared measurements | |
US3863071A | Infrared measuring system with channel spectra negation | |
CA982842A | Infrared measuring system | |
FR2180350A5 | Infra red analyser - measures a material property by measuring IR absorb-tion | |
JPS52116286A | Apparatus for displaying characteristics of sheet on cathodeeray tube by seanning gauge | |
US3803414A | Standardization of infrared measuring system | |
US3790796A | Method and apparatus for measurement of sheet opacity | |
CA963691A | Oscilloscope presentation of sheet profile from a scanning gage |