| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Electrical machinery and energy | |
| #3 | Audio-visual technology | |
| #4 | Semiconductors | |
| #5 | Civil engineering | |
| #6 | Machines | |
| #7 | Consumer goods |
| # | Name | Total Patents |
|---|---|---|
| #1 | Gilk Mathew L | 4 |
| #2 | Shell Dennis B | 3 |
| #3 | Nelson John E | 3 |
| #4 | Lopez Jose E | 2 |
| #5 | Fulcher Donald L | 2 |
| #6 | Kline Eric V | 2 |
| #7 | Sherry Jeffrey C | 2 |
| #8 | O'Sullivan John W | 2 |
| #9 | Johnson David A | 2 |
| #10 | Brian K Warwick | 1 |
| Publication | Filing date | Title |
|---|---|---|
| JP2007225599A | Test contact system for testing integrated circuit with package having array of signal and power contact | |
| JP2007026941A | Contact assembly | |
| JPH11317263A | Extended core connector | |
| JPH10150080A | Active wafer level contacting system |